GI20干涉儀
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- 公司名稱 北京華沛智同科技發(fā)展有限公司
- 品牌 其他品牌
- 型號
- 產(chǎn)地 英國
- 廠商性質(zhì) 經(jīng)銷商
- 更新時間 2016/4/19 16:27:28
- 訪問次數(shù) 2918
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The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure
non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.
• High precision flatness measurement of ground, lapped or semi-polished samples
• Measure 2μm per fringe with excellent clarity
• Surface roughness measurement from 1nm to 300nm Ra
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