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ATF7 Sensor

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西努光學(xué)創(chuàng)建于2003 年,主營工業(yè)顯微鏡及制樣設(shè)備、鏡片測定設(shè)備,高速攝像系統(tǒng)、工業(yè)內(nèi)窺鏡、機(jī)器視覺等工業(yè)及科研應(yīng)用的檢測設(shè)備及系統(tǒng)集成。
西努光學(xué)秉承“以光學(xué)為核心,為客戶提供解決方案”的經(jīng)驗(yàn)思路,經(jīng)過16年的努力,成為眾多企業(yè)、高??蒲袉挝惶峁└鞣N專業(yè)化的光學(xué)系統(tǒng)解決方案。并于2012 年導(dǎo)入SAP 管理系統(tǒng),通過系統(tǒng)資源整合,為客戶提供更優(yōu)質(zhì)、快捷的專業(yè)化服務(wù)。
2016 年,我們積極引進(jìn)檢測設(shè)備的同時(shí)導(dǎo)入制樣等配套設(shè)備以豐富我們實(shí)驗(yàn)室平臺,以更好的為客戶提供現(xiàn)場體驗(yàn),從微米到納米滿足客戶從制樣到結(jié)果分析的一站式體驗(yàn)服務(wù)。

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垂詢專線:400-6807517  

微信服務(wù)號:cinvoptics/西努光學(xué)

更多信息請登錄:http://www.cinv.cn 

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The ATF7
WDI’s ATF7 is a high speed, high accuracy, autonomous digital autofocus sensor. Its “Smart Sensor Architecture” (SSA) incorporates a semiconductor laser, built-in CMOS image sensor, FPGA and microprocessor for fast digital image processing. By projecting a laser line onto the sample and digitally processing the image, the ATF7 provides fast and
accurate measurements of the distance and direction to focus. This information can then be output directly to WDI’s MCM+ or MCZ controller, or to any compatible controller.
High Accuracy At Fast Speeds.
WDI’s ATF7 Sensor project their focusing laser directly through the objective lens of the microscope. This “Through The Lens” (TTL) technique allows the ATF7 to provide extremely accurate autofocus, with a success rate typically higher than 99%. The ATF7’s on-board digital processing allows it to couple this accuracy with extremely high speeds.
Static or Dynamic Autofocus
The ATF6 is continually assessing distance and direction to focus, updating its data every 0.6 milliseconds. This allows the sensor to keep samples in focus regardless of whether they are stationary or in motion. This powerful tracking autofocus makes the ATF7 perfect for scanning very large specimens quickly and precisely.
Maximum Flexibility
By projecting a laser line, the AFT7 sensor operates equally effectively on patterned and unpatterned specimens as well as diffusing and reflective surfaces making it ideal for media such as TFT arrays and photo masks. The ATF7 also automatically adjusts its laser intensity and sensor expose time, allowing it to adapt from low reflectivity (down to 1%) to highly reflective
(99%) surfaces. It is compatible with objectives from 2X to 100X, and wavelengths including UV, NUV and NIR. The ATF7 can also achieve focusing with a programmable Z offset function.
ATF7 SensorEasy Integration
All of the sensors in WDI’s ATF family are designed with ease of integration in mind. The ATF7 can be purchased as a
stand-alone sensor with analog output, or as full autofocus systems, integrated with either WDI’s MCM+ controller for
driving an external Z stage or MCZ controller which includes the ability to drive a two-phase stepper motor for Z actuation.
All WDI’s ATF sensors have small, standardized footprints and connections, and can output in either analog or digital
formats, making them both easy to install and easy to upgrade as application requirements evolve. The ATF7 is pin to
pin compatible with the ATF4SA and is thus a “plug and play” upgrade.
 

ATF7 AUTO FOCUS & TRACKING SYSTEM

 

Structured Light PatternLine Segment
Sensor WavelengthChoice of 660nm or 785nm
Image DetectorLine Scan CMOS
Internal Update Rate20kHz
Static Autofocus Accuracy± 1/4 Objective Depth of Focus
Fast Tracking Autofocus Accuracy± 1/2 Objective Depth of Focus

 

General Performance
Output Data Rate1.7kHz
Reflectivity Adaption Delay1ms
Laser TypeSemiconductor
Laser SafetyClass 2 660 nm
Weight250g
Dimensions40 X 40 X 120mm
Maximum Cable Length1.8m
ComplianceCE SEMI
External Requirements
Specimen Reflectivity1% ~ 99%
Glass Thickness> 0.5mm
Diffusing SpecimenYes
Specular SpecimenYes
Patterned SpecimenYes
Textured SpecimenYes
Operating Specifications
Operating Specifications18V ~ 25V, 24V Nominal
Operating Temperature18°C ~ 35°C
Storage Temperature10°C ~ 45°C
Humidity10% ~ 75% non condensing

 



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