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ATF5 Sensor

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西努光學(xué)創(chuàng)建于2003 年,主營工業(yè)顯微鏡及制樣設(shè)備、鏡片測定設(shè)備,高速攝像系統(tǒng)、工業(yè)內(nèi)窺鏡、機器視覺等工業(yè)及科研應(yīng)用的檢測設(shè)備及系統(tǒng)集成。
西努光學(xué)秉承“以光學(xué)為核心,為客戶提供解決方案”的經(jīng)驗思路,經(jīng)過16年的努力,成為眾多企業(yè)、高??蒲袉挝惶峁└鞣N專業(yè)化的光學(xué)系統(tǒng)解決方案。并于2012 年導(dǎo)入SAP 管理系統(tǒng),通過系統(tǒng)資源整合,為客戶提供更優(yōu)質(zhì)、快捷的專業(yè)化服務(wù)。
2016 年,我們積極引進檢測設(shè)備的同時導(dǎo)入制樣等配套設(shè)備以豐富我們實驗室平臺,以更好的為客戶提供現(xiàn)場體驗,從微米到納米滿足客戶從制樣到結(jié)果分析的一站式體驗服務(wù)。

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The ATF5 Sensor
WDI’s ATF5 is a high speed, high accuracy, autonomous digital autofocus sensor. Its “Smart Sensor Architecture” (SSA) incorporates a semiconductor laser, built-in CMOS image sensor, FPGA and microprocessor for fast digital image processing. By projecting multiple laser dots onto the sample and digitally processing the image, the ATF5 provides fast and accurate measurements of the distance and direction to focus. This information can then be output directly to WDI’s MCM+ or MCZ controller, or to any compatible controller.
High Accuracy At Fast Speeds
WDI’s ATF5 sensors project their focusing laser directly through the objective lens of the microscope. This “Through The Lens” (TTL) technique allows the ATF5 to provide extremely accurate autofocus, with a success rate typically higher than 99%. The ATF5’s on-board digital processing allows it to couple this accuracy with extremely high speeds.
Static or Dynamic Autofocus
The ATF5 is continually assessing distance and direction to focus, updating its data every 0.6 milliseconds. This allows the sensor to keep samples in focus regardless of whether they are stationary or in motion. This powerful tracking autofocus makes the ATF5 perfect for scanning very large specimens quickly and precisely.
Maximum Flexibility
By projecting multiple reference spots, the AFT5 sensor operates equally effectively on patterned and un-patterned specimens. This makes it ideal for media such as TFT arrays and photo masks. The ATF5 also automatically adjusts its laser intensity and sensor exposure time, allowing it to adapt from low reflectivity (down to 1%) to highly reflective (99%) surfaces. It is compatible with objectives from 2X to 100X, and wavelengths including UV, NUV and NIR. The ATF5 can also achieve focusing with a programmable offset function, allowing inspection of both the top and bottom surfaces of a transparent medium.
Easy Integration
All of the sensors in WDI’s ATF family are designed with ease of integration in mind. They are compatible with most types of infinity corrected microscope objectives. The ATF5 can be purchased as a full autofocus system, integrated with either WDI’s MCM+ controller for driving an external Z stage or MCZ controller which includes the ability to drive a two-phase stepper motor for Z actuation. All WDI’s ATF sensors have small, standardized footprints and connections, and can output in either analog or digital formats, making them both easy to install and easy to upgrade as application requirements evolve.
 

 ATF5 Sensor FOCUS & TRACKING SENSOR

 

Structured Light PatternSeven Dots
Sensor WavelengthChoice of 660nm or 785nm
Image DetectorLine Scan CMOS
Autofocus Update Rate20kHz
Static Autofocus Accuracy± 1/4 Objective Depth of Focus
Fast Tracking Autofocus Accuracy± 1/2 Objective Depth of Focus

 

General Performance
Output Data Rate1.7kHz in tracking mode
Reflectivity Adaption Delay2ms
aser TypeSemiconductor
Laser SafetyClass 2
Weight250g
Dimensions40 X 40 X 120mm
Maximum Cable Length1.8m
ComplianceCE SEMI
External Requirements
Specimen Reflectivity1% ~ 99%
Glass Thickness> 0.5mm
Diffusing SpecimenYes
Specular SpecimenYes
Patterned SpecimenYes
Textured SpecimenYes
Operating Specifications
Input Voltage18V ~ 25V, 24V Nominal
Operating Temperature18°C ~ 35°C
Storage Temperature10°C ~ 45°C
Humidity10% ~ 75% Non Condensing

 



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