TDP1000高壓差分探頭
The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply （SMPS）,

TDP1000高壓差分探頭

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Key performance specifications

• 1 GHz and 500 MHz probe bandwidth
• <1 pF differential input capacitance
• 1 MΩ differential input resistance
• ±42 v (DC + pk AC) differential input voltage
• >18 dB CMRR (at 250 MHz 50X attenuation)

Key features

• Outstanding electrical performance
  • Selectable bandwidth-limiting filters
  • DC reject

• Versatile DUT connectivity
  • Small compact probe head for probing small geometry circuit elements
  • Straight pin, square pin, solder down, variable pitch standard accessories
  • Robust design for reliability

• Easy to use
  • Provides automatic units scaling and readout on the oscilloscope display
  • TDP1000, TDP0500
    • Connect directly to oscilloscopes with the TekVPI™ probe interface
    • Easy access to scope-displayed probe menu for probe setup control and operating status information
    • Remote GPIB/USB probe control through the oscilloscope
    • AutoZero – zeros out output offset
  • P6251
  • Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

Applications

• High-speed switch mode power supply design
• CAN/LIN bus design
• Digital design and characterization
• Manufacturing engineering test
• Research and development

High-voltage differential probes

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

• Outstanding Electrical Performance
• Versatile Device-Under-Test Connectivity
• Ease of Use