產(chǎn)地類別	進(jìn)口	觸發(fā)模式	脈沖式
價(jià)格區(qū)間	面議	應(yīng)用領(lǐng)域	生物產(chǎn)業(yè),石油,航天,汽車,綜合

聚光太陽(yáng)模擬器

特征

1、AAA太陽(yáng)能模擬器

2、強(qiáng)度等級(jí)高達(dá)4000太陽(yáng)

3、<2％不均勻

4、緊湊的設(shè)計(jì)

5、燈泡壽命> 10,000次閃爍

應(yīng)用

1、太陽(yáng)模擬

2、聚光光伏

3、高功率光伏電池（三結(jié)電池）的表征

4、加速暴露測(cè)試

A typical Non-uniformity measurement. Graph is

interpolated from 64 measurements over a

5c mx5cm area. The data indicates a

non-uniformity of 1.87%

聚光太陽(yáng)光模擬器是一種緊湊而堅(jiān)固的光源，可產(chǎn)生非常高的太陽(yáng)輻照度，并且產(chǎn)生的不均勻性很小。Sciencetech專有的均質(zhì)化技術(shù)使FSSC能夠達(dá)到行業(yè)*佳的均勻度和功率水平。

FSSC可用于表征大尺寸為5cm x 5cm的太陽(yáng)能電池和其他設(shè)備?？梢酝ㄟ^(guò)功率控制在225到4000個(gè)太陽(yáng)之間的50個(gè)步長(zhǎng)中設(shè)置誤差。

使用Sciencetech FSSC太陽(yáng)能濾光片，該裝置符合AM1.5D ASTM光譜標(biāo)準(zhǔn)。

Wavelength Band (nm)	FSSC Measure- ment (%, with AM1.5D Filter)	Air Mass 1.5D ideal spectral match (%)
400-500	15.1	14.2
500-600	18.0	16.4
600-700	16.1	15.4
700-800	11.7	12.7
800-900	10.9	10.7
900-1100	11.5	13.9

規(guī)格

Model	FSSC
Illumination Intensity	From 225 to 4000 suns (lower concentration levels possible with ND filtering)
Illumination Intensity Reference	Built into homogenizer, 5.377uA/Sun 11.0mA typical @2000 Suns
Target Area	5cm x 5cm
Angle of Exit	50 % within 30 degrees, 47.5 degrees maximum angle
Non-Uniformity of Irradiance	<2% typical
Working Distance	From 1 to 7 mm (3mm typical)
Spectral Match	Class A AM1.5D typical
Spectral Adjustability	From AM1.0 to AM2.0 with different filters
Flash Duration	1mSec around peak (90% points), 2.2mSec at 50% points t
Minimum # of flashes per lamp	20,000 flashes typical @2000 suns , 100,000 flashes @ 400 suns *
Flash to Flash Repeatability	+/- 5%, +/- 3% typical **
Flash Interval	5 seconds typical , 2 seconds minimum
Energy Setting	75-2400 Joules (50 steps)
Dimensions (cm)	36 x 36 x 78
Dimensions including mounting frame (cm)	61 x 61 x 82

T Flash duration can be widened and profile flattened with appropriate power supply, peak power level will be reduced.

* Higher power settings can degrade lamp life more quickly

** flash to flash repeatability can be reduced below 2% with power supply modification

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